Comparison experiment and simulation for film thickness in vacuum evaporation equipment

Computational conditions

Comparison experiment and simulation for film thickness in vacuum evaporation equipment
  1. Evaporation atom : Au
  2. Background Ar gas pressure : 1.8E-3, 0.05, 0.1, 0.415, 0.867 [Pa]

Result

  •  Ar gas pressure dependency,  comparison with experiment.

    Ar gas pressure dependency, comparison with experiment.

  • Distribution of incident speed

    Distribution of incident speed

  • Density,Temperature,Pressure and velocity spatial distribution and adsorbed flux on the substrate

    Density,Temperature,Pressure and velocity spatial distribution and adsorbed flux on the substrate